Precise characterization of nanometer-scale systems using interferometric scattering microscopy and Bayesian analysis

Published in Applied Optics, 2023

Recommended citation: Xander M. de Wit, Amelia W. Paine, Caroline Martin, Aaron M. Goldfain, Rees F. Garmann, and Vinothan N. Manoharan. 9/20/2023. “Precise characterization of nanometer-scale systems using interferometric scattering microscopy and Bayesian analysis.” Applied Optics, 62, 27.